Materials Characterization: Introduction to Microscopic and Spectroscopic Methods (Record no. 45522)

MARC details
000 -LEADER
fixed length control field 01622 a2200193 4500
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783527334636
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.11 LEN
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Leng, Yang
245 ## - TITLE STATEMENT
Title Materials Characterization: Introduction to Microscopic and Spectroscopic Methods
250 ## - EDITION STATEMENT
Edition statement 2
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Name of publisher, distributor, etc Wilely -VCH
Place of publication, distribution, etc Weinheim
Date of publication, distribution, etc 2013
300 ## - PHYSICAL DESCRIPTION
Extent 376
520 ## - SUMMARY, ETC.
Summary, etc ow in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Microstructure Analysis
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element X-ray Diffraction
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electron Microscopy
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Spectroscopy
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Book Bank
Source of classification or shelving scheme Dewey Decimal Classification

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