TY  - GEN
AU  - Zhang, Sam
AU  - Li, Lin
AU  - Kumar, Ashok
TI  - Materials Characterizations Techniques 
SN  - 9781498770460
U1  - 620.11 ZHA 
PY  - 2009///
CY  -  London
PB  -  CRC Press
KW  - Materials Characterization
KW  - X-ray-photoelectronand
KW  - UV spectroscopy
KW  - Electrophoresis Chromatography
N2  - Experts must be able to analyze and distinguish all materialsor combinations of materials, in use today―whether they be metals, ceramics, polymers, semiconductorsor composites. To understand a material’s structure, how that structure determines its propertiesand how that material will subsequently work in technological applications, researchers apply basic principles of chemistry, physicsand biology to address its scientific fundamentals, as well as how it is processed and engineered for use. Emphasizing practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used, advanced surface and structural characterization techniques for quality assurance, contamination controland process improvement. This useful volume: Explores scientific processes to characterize materials using modern technologies Provides analysis of materials’ performance under specific use conditions Focuses on the interrelationships and interdependence between processing, structure, propertiesand performance Details the sophisticated instruments involved in an interdisciplinary approach to understanding the wide range of mutually interacting processes, mechanismsand materials Covers electron, X-ray-photoelectronand UV spectroscopy; scanning-electron, atomic-force, transmission-electronand laser-confocal-scanning-florescent microscopyand gel electrophoresis chromatography Presents the fundamentals of vacuum, as well as X-ray diffraction principles Explaining appropriate uses and related technical requirements for characterization techniques, the authors omit lengthy and often intimidating derivations and formulations
ER  -