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	1.	CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test by Pavlov, Andrei Sachdev, Manoj Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: New Delhi : Springer (India) Private Limited , c2008 Availability: Items available for loan: Alliance College of Engineering and Design (1)Call number: 621.38152 PAV. Place hold Request article Add to cart (remove)
	2.	No cover image available CMOS Circuit Design, Layout, and Simulation R. Jacob Baker. by Baker, R. Jacob, 1964- Institute of Electrical and Electronics Engineers Edition: 2nd ed. Material type: Text; Format: print ; Literary form: Not fiction Publication details: New Delhi : Wiley India Private Limited , c2005 Availability: Not available: Alliance College of Engineering and Design: Lost (1). Request article Add to cart (remove)
	3.	Basic VLSI Design by Pucknell, Douglas A Eshraghian, Kamran Series: Silcon systems engineering series Edition: 3 Material type: Text; Format: print ; Literary form: Not fiction Publication details: New Delhi : PHI Learning Private Limited , c1994 Availability: Items available for loan: Alliance College of Engineering and Design (3)Call number: 621.395 PUC, ... Items available for reference: Alliance College of Engineering and Design: Not for loan (1)Call number: 621.395 PUC. Not available: Alliance College of Engineering and Design: Lost (1). Lists: New Arrivals for the Month of September - 2023. Place hold Request article Add to cart (remove)
	4.	Analysis and Design of Analog Integrated Circuits by Gray, Paul R Meyer, Robert G Edition: 3rd Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : : Wiley, , 1993 Online resources: Table of Contents only Publisher description Availability: Items available for reference: Alliance College of Engineering and Design: Not for loan (1)Call number: 621.3815 GRA. Request article Add to cart (remove)
	5.	Analysis and Design of Analog Integrated Circuits by Gray, P R Meyer, R G Edition: 2nd Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : : Wiley, , 1984 Availability: Items available for reference: Alliance College of Engineering and Design: Not for loan (1)Call number: 621.3815 GRA. Request article Add to cart (remove)
	6.	CMOS Digital Integrated Circuits: Analysis and Design by Kang, Sung-Mo Leblebici, Yusuf Kim, Chulwoo Edition: 4th Publication details: New Delhi: : McGraw Hill Education (India) Private Limited, , 2015 Availability: Items available for loan: Alliance College of Engineering and Design (1)Call number: 621.395 KAN. Items available for reference: Alliance College of Engineering and Design: Not for loan (1)Call number: 621.395 KAN. Place hold Request article Add to cart (remove)
	7.	Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Sachdev, Manoj De Gyvez, José Pineda Edition: 2nd ed. Material type: Text Publication details: New Delhi : Springer (India) Private Limited , 2007 Availability: Items available for loan: Alliance College of Engineering and Design (2)Call number: 621.39732 SAC, ... Lists: New Arrivals for the Month of September - 2023. Place hold Request article Add to cart (remove)