Image from Google Jackets

Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions

By: By: Publication details: Boca Raton: CRC Press, 2023Description: 129ISBN:
  • 9781032375106
Subject(s): DDC classification:
  • 620.11 KUM
Summary: The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.
List(s) this item appears in: New Arrivals for the Month of November - 2023
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Reference Book Reference Book Alliance College of Engineering and Design Mechanical Engineering 620.11 KUM (Browse shelf(Opens below)) Not for loan E12849
Total holds: 0

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

There are no comments on this title.

to post a comment.