000			01622 a2200193 4500
020			_a9783527334636
082			_a 620.11 LEN
100			_aLeng, Yang
245			_aMaterials Characterization: Introduction to Microscopic and Spectroscopic Methods
250			_a2
260			_bWilely -VCH _aWeinheim _c2013
300			_a376
520			_aow in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy.
650			_aMicrostructure Analysis
650			_aX-ray Diffraction
650			_aElectron Microscopy
650			_aSpectroscopy
942			_cBB _2ddc
999			_c45522 _d45522