| 000 | 01124 a2200169 4500 | ||
|---|---|---|---|
| 020 | _a9781032375106 | ||
| 082 | _a620.11 KUM | ||
| 100 | _aKumar, Sateesh | ||
| 245 | _aAdvanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions | ||
| 260 |
_aBoca Raton _bCRC Press _c2023 |
||
| 300 | _a129 | ||
| 520 | _aThe book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. | ||
| 650 | _aMaterials-Testing | ||
| 700 | _aSingh, M. Muralidhar | ||
| 700 | _aRam Krishna | ||
| 942 |
_cBB _2ddc |
||
| 999 |
_c46122 _d46122 |
||