CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies:

Pavlov, Andrei.

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test - New Delhi Springer (India) Private Limited c2008. - 193 p.

9788132202325


Metal oxide semiconductors, Complementary
Random access memory.
Nanoelectronics.

621.38152 PAV