CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: (Record no. 40318)

MARC details
000 -LEADER
fixed length control field 00746nam a2200253Ia 4500
001 - CONTROL NUMBER
control field ocn237176470
003 - CONTROL NUMBER IDENTIFIER
control field OCoLC
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220118112413.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION
fixed length control field m d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cnu---unuuu
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 080801s2008 ne sb 001 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9788132202325
040 ## - CATALOGING SOURCE
Transcribing agency A
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.38152 PAV
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Pavlov, Andrei.
245 10 - TITLE STATEMENT
Title CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies:
Medium Process-Aware SRAM Design and Test
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc New Delhi
Name of publisher, distributor, etc Springer (India) Private Limited
Date of publication, distribution, etc c2008.
300 ## - PHYSICAL DESCRIPTION
Extent 193 p.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Metal oxide semiconductors, Complementary
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Random access memory.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanoelectronics.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Sachdev, Manoj.
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Book

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