Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Kumar, Sateesh
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Boca Raton CRC Press 2023 - 129
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.
9781032375106
Materials-Testing
620.11 KUM
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Boca Raton CRC Press 2023 - 129
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.
9781032375106
Materials-Testing
620.11 KUM
