Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Record no. 46122)

MARC details
000 -LEADER
fixed length control field 01124 a2200169 4500
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781032375106
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.11 KUM
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kumar, Sateesh
245 ## - TITLE STATEMENT
Title Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Boca Raton
Name of publisher, distributor, etc CRC Press
Date of publication, distribution, etc 2023
300 ## - PHYSICAL DESCRIPTION
Extent 129
520 ## - SUMMARY, ETC.
Summary, etc The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Materials-Testing
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Singh, M. Muralidhar
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Ram Krishna
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Book Bank
Source of classification or shelving scheme Dewey Decimal Classification

No items available.