CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

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Material type: Text

TextPublication details: New Delhi: Springer (India) Private Limited, c2008Description: 193 pISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Book	Alliance College of Engineering and Design	Electronics and Communication Engineering	621.38152 PAV (Browse shelf(Opens below))	Available		E11081

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