Image from Google Jackets

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

By: By: Material type: TextTextPublication details: New Delhi: Springer (India) Private Limited, c2008Description: 193 pISBN:
  • 9788132202325
Subject(s): DDC classification:
  • 621.38152 PAV
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Book Book Alliance College of Engineering and Design Electronics and Communication Engineering 621.38152 PAV (Browse shelf(Opens below)) Available E11081
Total holds: 0

There are no comments on this title.

to post a comment.
Previous
Back to results
Next
Close
Share