CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
Material type:
TextPublication details: New Delhi: Springer (India) Private Limited, c2008Description: 193 pISBN: - 9788132202325
- 621.38152 PAV
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
Book
|
Alliance College of Engineering and Design | Electronics and Communication Engineering | 621.38152 PAV (Browse shelf(Opens below)) | Available | E11081 |
Total holds: 0
Browsing Alliance College of Engineering and Design shelves, Collection: Electronics and Communication Engineering Close shelf browser (Hides shelf browser)
| 621.38152 LIO Advanced Semiconductor Device Physics and Modeling | 621.38152 MAR Semiconductor Modeling Techniques | 621.38152 NIX Thin Films: Stresses and Mechanical Properties III Symposium Held December 2-5, 1991, Boston, Massachusetts, USA | 621.38152 PAV CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: | 621.38152 ROC Materials Science of Semiconductors | 621.38152 ROC Materials Science of Semiconductors | 621.38152 SNO Semiconductor Device Modelling |
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