Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions

By:

Kumar, Sateesh

By:

Publication details: Boca Raton: CRC Press, 2023Description: 129ISBN:

9781032375106

Subject(s):

Materials-Testing

DDC classification:

620.11 KUM

Summary: The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

List(s) this item appears in: New Arrivals for the Month of November - 2023

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Book	Alliance College of Engineering and Design	Mechanical Engineering	620.11 KUM (Browse shelf(Opens below))	Not for loan		E12849

Total holds: 0

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The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

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